Parameters |
Factory Lead Time |
1 Week |
Mount |
Surface Mount |
Mounting Type |
Surface Mount |
Package / Case |
28-LCC (J-Lead) |
Supplier Device Package |
28-PLCC |
Operating Temperature |
-40°C~85°C TA |
Packaging |
Tube |
Published |
2010 |
Series |
100S |
Part Status |
Obsolete |
Moisture Sensitivity Level (MSL) |
2 (1 Year) |
Type |
D-Type |
Max Operating Temperature |
85°C |
Min Operating Temperature |
-40°C |
Voltage - Supply |
-4.2V~-5.5V |
Frequency |
800MHz |
Base Part Number |
100S331 |
Function |
Master Reset |
Output Type |
Differential |
Number of Elements |
3 |
Clock Frequency |
800MHz |
Quiescent Current |
-35mA |
Current - Quiescent (Iq) |
-35mA |
Number of Bits per Element |
1 |
Trigger Type |
Positive Edge |
Clock Edge Trigger Type |
Positive Edge |
RoHS Status |
ROHS3 Compliant |
SY100S331JY Overview
The flip flop is packaged in a case of 28-LCC (J-Lead). It is contained within the Tubepackage. As configured, the output uses Differential. It is configured with the trigger Positive Edge. Surface Mountis positioned in the way of this electronic part. The JK flip flop operates at -4.2V~-5.5Vvolts. A temperature of -40°C~85°C TAis used in the operation. This electronic flip flop is of type D-Type. FPGAs belonging to the 100Sseries contain this type of chip. It should not exceed 800MHzin terms of its output frequency. There are 3 elements in it. As a result, it consumes -35mA quiescent current and is not affected by external forces. You can search similar parts based on 100S331. Surface Mount mounts this electronic component. Its clock edge trigger type is Positive Edge. There is -35mA quiescent current consumption by it. If the operating temperature is lower than 85°C, it is recommended. Operating temperatures should be above -40°C. The frequency can be set to 800MHz.
SY100S331JY Features
Tube package
100S series
SY100S331JY Applications
There are a lot of Microchip Technology SY100S331JY Flip Flops applications.
- Parallel data storage
- 2 – Bit synchronous counter
- Automotive
- Synchronous counter
- Event Detectors
- Clock pulse
- Data transfer
- ESD performance
- High Performance Logic for test systems
- Common Clocks