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8V182512IDGGREP

IC ABT SCAN TEST DEV3.3V 64TSSOP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-8V182512IDGGREP
  • Package: 64-TFSOP (0.240, 6.10mm Width)
  • Datasheet: -
  • Stock: 445
  • Description: IC ABT SCAN TEST DEV3.3V 64TSSOP(Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Lifecycle Status ACTIVE (Last Updated: 5 days ago)
Contact Plating Gold
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 64-TFSOP (0.240, 6.10mm Width)
Number of Pins 64
Weight 262.601633mg
Operating Temperature -40°C~85°C
Packaging Tape & Reel (TR)
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 64
ECCN Code EAR99
Packing Method TR
Technology BICMOS
Terminal Position DUAL
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 2
Supply Voltage 2.7V~3.6V
Terminal Pitch 0.5mm
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Base Part Number 8V182512
Pin Count 64
Qualification Status Not Qualified
Output Type TTL
Operating Supply Voltage 3.3V
Number of Elements 2
Polarity Non-Inverting
Max Supply Voltage 3.6V
Min Supply Voltage 2.7V
Number of Ports 2
Number of Bits 18
Propagation Delay 20 ns
Quiescent Current 24mA
Family LVT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE WITH SERIES RESISTOR
Logic Type ABT Scan Test Device With Universal Bus Transceivers
Prop. Delay@Nom-Sup 5.7 ns
Trigger Type POSITIVE EDGE
High Level Output Current -32mA
Low Level Output Current 64mA
Control Type INDEPENDENT CONTROL
Translation N/A
Height 1.2mm
Length 17mm
Width 6.1mm
Thickness 1.15mm
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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