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74FCT374ATSOG

4.5V~5.5V D-Type Flip Flop 74FCT374 1mA 74FCT Series 20-SOIC (0.295, 7.50mm Width)


  • Manufacturer: Renesas Electronics America Inc.
  • Nocochips NO: 668-74FCT374ATSOG
  • Package: 20-SOIC (0.295, 7.50mm Width)
  • Datasheet: PDF
  • Stock: 819
  • Description: 4.5V~5.5V D-Type Flip Flop 74FCT374 1mA 74FCT Series 20-SOIC (0.295, 7.50mm Width)(Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Mounting Type Surface Mount
Package / Case 20-SOIC (0.295, 7.50mm Width)
Supplier Device Package 20-SOIC
Operating Temperature -40°C~85°C TA
Packaging Tube
Series 74FCT
Part Status Active
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Base Part Number 74FCT374
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 1
Current - Quiescent (Iq) 1mA
Current - Output High, Low 15mA 48mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 6.5ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 6pF
RoHS Status ROHS3 Compliant

74FCT374ATSOG Overview


The flip flop is packaged in a case of 20-SOIC (0.295, 7.50mm Width). D flip flop is included in the Tubepackage. There is a Tri-State, Non-Invertedoutput configured with it. It is configured with a trigger that uses a value of Positive Edge. In this case, the electronic component is mounted in the way of Surface Mount. With a supply voltage of 4.5V~5.5V volts, it operates. Temperature is set to -40°C~85°C TA. The type of this D latch is D-Type. This type of FPGA is a part of the 74FCT series. The list contains 1 elements. During its operation, it consumes 1mA quiescent energy. Members of the 74FCT374family make up this object. A JK flip flop with a 6pFfarad input capacitance is used here.

74FCT374ATSOG Features


Tube package
74FCT series

74FCT374ATSOG Applications


There are a lot of Renesas Electronics America Inc. 74FCT374ATSOG Flip Flops applications.

  • Instrumentation
  • Data Synchronizers
  • Latch-up performance
  • Power down protection
  • Test & Measurement
  • Load Control
  • Count Modes
  • High Performance Logic for test systems
  • Parallel data storage
  • Guaranteed simultaneous switching noise level

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