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74VCX16821MTD

1.4V~3.6V 250MHz D-Type Flip Flop 74VCX16821 20μA 74VCX Series 56-TFSOP (0.240, 6.10mm Width)


  • Manufacturer: ON Semiconductor
  • Nocochips NO: 598-74VCX16821MTD
  • Package: 56-TFSOP (0.240, 6.10mm Width)
  • Datasheet: PDF
  • Stock: 285
  • Description: 1.4V~3.6V 250MHz D-Type Flip Flop 74VCX16821 20μA 74VCX Series 56-TFSOP (0.240, 6.10mm Width)(Kg)

Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 56-TFSOP (0.240, 6.10mm Width)
Supplier Device Package 56-TSSOP
Operating Temperature -40°C~85°C TA
Packaging Tube
Series 74VCX
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 1.4V~3.6V
Base Part Number 74VCX16821
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 2
Clock Frequency 250MHz
Current - Quiescent (Iq) 20μA
Current - Output High, Low 24mA 24mA
Number of Bits per Element 10
Max Propagation Delay @ V, Max CL 3.5ns @ 3.3V, 30pF
Trigger Type Positive Edge
Input Capacitance 6pF

74VCX16821MTD Overview


The package is in the form of 56-TFSOP (0.240, 6.10mm Width). It is included in the package Tube. This output is configured with Tri-State, Non-Inverted. It is configured with a trigger that uses a value of Positive Edge. Surface Mountis in the way of this electric part. The JK flip flop operates with an input voltage of 1.4V~3.6V volts. The operating temperature is -40°C~85°C TA. There is D-Type type of electronic flip flop associated with this device. It belongs to the 74VCXseries of FPGAs. There should be no greater frequency than 250MHzon its output. The list contains 2 elements. There is 20μA quiescent consumption. JK flip flop belongs to 74VCX16821 family. The input capacitance of this T flip flop is 6pF farads, which is defined as the capacitance between the input terminals of an op amp with either input grounded.

74VCX16821MTD Features


Tube package
74VCX series

74VCX16821MTD Applications


There are a lot of ON Semiconductor 74VCX16821MTD Flip Flops applications.

  • Test & Measurement
  • High Performance Logic for test systems
  • Memory
  • Memory
  • Individual Asynchronous Resets
  • Frequency Divider circuits
  • Pattern generators
  • CMOS Process
  • Counters
  • Consumer

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