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MC74HCT574ADTR2

4.5V~5.5V 30MHz D-Type Flip Flop 4μA 74HCT Series 20-TSSOP (0.173, 4.40mm Width)


  • Manufacturer: Rochester Electronics, LLC
  • Nocochips NO: 699-MC74HCT574ADTR2
  • Package: 20-TSSOP (0.173, 4.40mm Width)
  • Datasheet: PDF
  • Stock: 918
  • Description: 4.5V~5.5V 30MHz D-Type Flip Flop 4μA 74HCT Series 20-TSSOP (0.173, 4.40mm Width)(Kg)

Details

Tags

Parameters
Number of Elements 1
Clock Frequency 30MHz
Current - Quiescent (Iq) 4μA
Current - Output High, Low 6mA 6mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 30ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 10pF
RoHS Status ROHS3 Compliant
Mounting Type Surface Mount
Package / Case 20-TSSOP (0.173, 4.40mm Width)
Supplier Device Package 20-TSSOP
Operating Temperature -55°C~125°C TA
Packaging Tape & Reel (TR)
Series 74HCT
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Function Standard
Output Type Tri-State, Non-Inverted

MC74HCT574ADTR2 Overview


It is embeded in 20-TSSOP (0.173, 4.40mm Width) case. It is contained within the Tape & Reel (TR)package. Tri-State, Non-Invertedis the output configured for it. This trigger is configured to use Positive Edge. Surface Mountis positioned in the way of this electronic part. The JK flip flop operates at a voltage of 4.5V~5.5V. -55°C~125°C TAis the operating temperature. This D latch has the type D-Type. It is a type of FPGA belonging to the 74HCT series. A frequency of 30MHzshould not be exceeded by its output. In total, it contains 1 elements. It consumes 4μA of quiescent There is 10pF input capacitance for this T flip flop.

MC74HCT574ADTR2 Features


Tape & Reel (TR) package
74HCT series

MC74HCT574ADTR2 Applications


There are a lot of Rochester Electronics, LLC MC74HCT574ADTR2 Flip Flops applications.

  • ESD performance
  • Circuit Design
  • ESCC
  • Instrumentation
  • Common Clocks
  • QML qualified product
  • Pattern generators
  • Frequency division
  • Data Synchronizers
  • High Performance Logic for test systems

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