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MC74LCX374MELG

2V~3.6V 150MHz D-Type Flip Flop 10μA 74LCX Series 20-SOIC (0.209, 5.30mm Width)


  • Manufacturer: Rochester Electronics, LLC
  • Nocochips NO: 699-MC74LCX374MELG
  • Package: 20-SOIC (0.209, 5.30mm Width)
  • Datasheet: PDF
  • Stock: 683
  • Description: 2V~3.6V 150MHz D-Type Flip Flop 10μA 74LCX Series 20-SOIC (0.209, 5.30mm Width)(Kg)

Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 20-SOIC (0.209, 5.30mm Width)
Supplier Device Package SOEIAJ-20
Operating Temperature -40°C~85°C TA
Packaging Tape & Reel (TR)
Series 74LCX
Part Status Obsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Type D-Type
Voltage - Supply 2V~3.6V
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 1
Clock Frequency 150MHz
Current - Quiescent (Iq) 10μA
Current - Output High, Low 24mA 24mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 8.5ns @ 3.3V, 50pF
Trigger Type Positive Edge
Input Capacitance 7pF
RoHS Status ROHS3 Compliant

MC74LCX374MELG Overview


The package is in the form of 20-SOIC (0.209, 5.30mm Width). Package Tape & Reel (TR)embeds it. As configured, the output uses Tri-State, Non-Inverted. The trigger configured with it uses Positive Edge. Surface Mountis occupied by this electronic component. The supply voltage is set to 2V~3.6V. A temperature of -40°C~85°C TAis considered to be the operating temperature. It belongs to the type D-Typeof flip flops. In this case, it is a type of FPGA belonging to the 74LCX series. Its output frequency should not exceed 150MHz. A total of 1elements are contained within it. As a result, it consumes 10μA quiescent current and is not affected by external forces. This T flip flop has a capacitance of 7pF farads at the input.

MC74LCX374MELG Features


Tape & Reel (TR) package
74LCX series

MC74LCX374MELG Applications


There are a lot of Rochester Electronics, LLC MC74LCX374MELG Flip Flops applications.

  • Storage Registers
  • Single Down Count-Control Line
  • Frequency division
  • Latch
  • Parallel data storage
  • Patented noise
  • Balanced Propagation Delays
  • ATE
  • Memory
  • High Performance Logic for test systems

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