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SI5391A-A-GM

Clock Generator 1GHz Clock Generators MultiSynth? Series 64-VFQFN Exposed Pad Surface Mount 1.71V~3.47V Tray


  • Manufacturer: Silicon Labs
  • Nocochips NO: 715-SI5391A-A-GM
  • Package: 64-VFQFN Exposed Pad
  • Datasheet: PDF
  • Stock: 975
  • Description: Clock Generator 1GHz Clock Generators MultiSynth? Series 64-VFQFN Exposed Pad Surface Mount 1.71V~3.47V Tray (Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Mounting Type Surface Mount
Package / Case 64-VFQFN Exposed Pad
Operating Temperature -40°C~85°C
Packaging Tray
Series MultiSynth™
Part Status Active
Moisture Sensitivity Level (MSL) 2 (1 Year)
Type Clock Generator
Voltage - Supply 1.71V~3.47V
Output CML, HCSL, LVDS, LVPECL, LVCMOS
Number of Circuits 1
Frequency (Max) 1GHz
Input LVCMOS, Crystal
Ratio - Input:Output 4:12
PLL Yes
Differential - Input:Output Yes/Yes
Divider/Multiplier Yes/No

SI5391A-A-GM Overview


Clock ICs are packaged using the Tray method. Clock PLL is embedded in the 64-VFQFN Exposed Pad package. As the Clock PLL's input, LVCMOS, Crystal is designed to be used in order to generate the clock signal. For full access to the electronic component's capabilities, 1 circuits are implemented. RF synthesizers based on this clock provide frequencies up to 1GHz maximum. This component can be conveniently installed on the panel thanks to the Surface Mount. There should be 1.71V~3.47V provided with this RF synthesizer. As determined by the test statistics, the ambient temperature should be set to -40°C~85°C. CML, HCSL, LVDS, LVPECL, LVCMOS is designed for clock generator's output. This electronic component can be classified into Clock Generator. A member of the MultiSynth? series, this electronic component is made of plastic.

SI5391A-A-GM Features


Available in the 64-VFQFN Exposed Pad

SI5391A-A-GM Applications


There are a lot of Silicon Labs SI5391A-A-GM Clock Generators applications.

  • Test equipment
  • Signal demodulation
  • HDD recorders
  • GPS systems
  • Pulsed digital systems
  • Automatic control system test
  • FM demodulation networks for FM operations
  • Automatic control
  • Computers to manage memory cards
  • Smartphones

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