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SN74ABT18245ADGGR

IC SCAN-TEST-DEV/TXRX 56-TSSOP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74ABT18245ADGGR
  • Package: 56-TFSOP (0.240, 6.10mm Width)
  • Datasheet: -
  • Stock: 993
  • Description: IC SCAN-TEST-DEV/TXRX 56-TSSOP(Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Lifecycle Status ACTIVE (Last Updated: 1 day ago)
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 56-TFSOP (0.240, 6.10mm Width)
Number of Pins 56
Weight 252.792698mg
Operating Temperature -40°C~85°C
Packaging Cut Tape (CT)
Series 74ABT
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 56
ECCN Code EAR99
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Additional Feature WITH DIRECTION CONTROL
Packing Method TR
Technology BICMOS
Terminal Position DUAL
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 2
Supply Voltage 4.5V~5.5V
Terminal Pitch 0.5mm
Base Part Number 74ABT18245
Pin Count 56
Number of Elements 2
Polarity Non-Inverting
Power Supplies 5V
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Number of Ports 2
Number of Bits 18
Propagation Delay 13.6 ns
Quiescent Current 33mA
Turn On Delay Time 13.6 ns
Family ABT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE
Logic Type Scan Test Device with Bus Transceivers
Max I(ol) 0.064 A
Prop. Delay@Nom-Sup 5.4 ns
Control Type COMMON CONTROL
Power Supply Current-Max (ICC) 38mA
Translation N/A
Height 1.2mm
Length 14mm
Width 6.1mm
Thickness 1.15mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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