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SN74ABT18504PM

IC SCAN-TEST-DEV/TXRX 64-LQFP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74ABT18504PM
  • Package: 64-LQFP
  • Datasheet: PDF
  • Stock: 566
  • Description: IC SCAN-TEST-DEV/TXRX 64-LQFP(Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Lifecycle Status ACTIVE (Last Updated: 1 day ago)
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 64-LQFP
Number of Pins 64
Weight 342.689036mg
Operating Temperature -40°C~85°C
Packaging Tray
Series 74ABT
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Number of Terminations 64
ECCN Code EAR99
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Additional Feature WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
Technology BICMOS
Terminal Position QUAD
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 1
Supply Voltage 4.5V~5.5V
Terminal Pitch 0.5mm
Base Part Number 74ABT18504
Pin Count 64
Operating Supply Voltage 5V
Number of Elements 1
Polarity Non-Inverting
Power Supplies 5V
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Load Capacitance 50pF
Number of Ports 2
Number of Bits 20
Propagation Delay 17 ns
Quiescent Current 36mA
Turn On Delay Time 17 ns
Family ABT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE
Logic Type Scan Test Device with Universal Bus Transceivers
Prop. Delay@Nom-Sup 6.5 ns
High Level Output Current -32mA
Low Level Output Current 64mA
Control Type INDEPENDENT CONTROL
Power Supply Current-Max (ICC) 40mA
Translation N/A
Height 1.6mm
Length 10mm
Width 10mm
Thickness 1.4mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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