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SN74ABT18504PMG4

IC SCAN TEST DEVICE 20BIT 64LQFP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74ABT18504PMG4
  • Package: LQFP
  • Datasheet: -
  • Stock: 788
  • Description: IC SCAN TEST DEVICE 20BIT 64LQFP(Kg)

Details

Tags

Parameters
Mount Surface Mount
Package / Case LQFP
Number of Pins 64
Weight 342.689036mg
JESD-609 Code e4
Moisture Sensitivity Level (MSL) 3
Number of Terminations 64
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Max Operating Temperature 85°C
Min Operating Temperature -40°C
Additional Feature WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
Packing Method TRAY
Technology BICMOS
Terminal Position QUAD
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 1
Supply Voltage 5V
Terminal Pitch 0.5mm
Pin Count 64
Number of Elements 1
Polarity Non-Inverting
Power Supplies 5V
Temperature Grade INDUSTRIAL
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Number of Ports 2
Number of Bits 20
Propagation Delay 17 ns
Quiescent Current 36mA
Turn On Delay Time 17 ns
Family ABT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE
Prop. Delay@Nom-Sup 6.5 ns
High Level Output Current -32mA
Low Level Output Current 64mA
Control Type INDEPENDENT CONTROL
Power Supply Current-Max (ICC) 40mA
Translation N/A
Height 1.45mm
Length 10.2mm
Width 10.2mm
Radiation Hardening No
RoHS Status RoHS Compliant
Lead Free Lead Free
See Relate Datesheet

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