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SN74ABT273PWRE4

4.5V~5.5V 150MHz D-Type Flip Flop 400μA 74ABT Series 20-TSSOP (0.173, 4.40mm Width)


  • Manufacturer: Rochester Electronics, LLC
  • Nocochips NO: 699-SN74ABT273PWRE4
  • Package: 20-TSSOP (0.173, 4.40mm Width)
  • Datasheet: PDF
  • Stock: 547
  • Description: 4.5V~5.5V 150MHz D-Type Flip Flop 400μA 74ABT Series 20-TSSOP (0.173, 4.40mm Width)(Kg)

Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 20-TSSOP (0.173, 4.40mm Width)
Supplier Device Package 20-TSSOP
Operating Temperature -40°C~85°C TA
Packaging Tape & Reel (TR)
Series 74ABT
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Function Master Reset
Output Type Non-Inverted
Number of Elements 1
Clock Frequency 150MHz
Current - Quiescent (Iq) 400μA
Current - Output High, Low 32mA 64mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 6.8ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 7pF
RoHS Status ROHS3 Compliant

SN74ABT273PWRE4 Overview


20-TSSOP (0.173, 4.40mm Width)is the packaging method. The package Tape & Reel (TR)contains it. It is configured with Non-Invertedas an output. The trigger configured with it uses Positive Edge. This electronic part is mounted in the way of Surface Mount. A 4.5V~5.5Vsupply voltage is required for it to operate. Currently, the operating temperature is -40°C~85°C TA. It is an electronic flip flop with the type D-Type. In terms of FPGAs, it belongs to the 74ABT series. You should not exceed 150MHzin the output frequency of the device. D latch consists of 1 elements. Despite external influences, it consumes 400μAof quiescent current. The input capacitance of this T flip flop is 7pF farads, which is defined as the capacitance between the input terminals of an op amp with either input grounded.

SN74ABT273PWRE4 Features


Tape & Reel (TR) package
74ABT series

SN74ABT273PWRE4 Applications


There are a lot of Rochester Electronics, LLC SN74ABT273PWRE4 Flip Flops applications.

  • Counters
  • High Performance Logic for test systems
  • Asynchronous counter
  • Balanced Propagation Delays
  • Registers
  • Latch
  • ESCC
  • ESD performance
  • Storage registers
  • Data storage

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