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SN74BCT8240ANT

IC SCAN TEST DEVICE BUFF 24-DIP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74BCT8240ANT
  • Package: 24-DIP (0.300, 7.62mm)
  • Datasheet: -
  • Stock: 342
  • Description: IC SCAN TEST DEVICE BUFF 24-DIP(Kg)

Details

Tags

Parameters
Mount Through Hole
Mounting Type Through Hole
Package / Case 24-DIP (0.300, 7.62mm)
Number of Pins 24
Operating Temperature 0°C~70°C
Packaging Tube
Series 74BCT
Pbfree Code yes
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 24
ECCN Code EAR99
Additional Feature SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Subcategory Bus Driver/Transceiver
Technology BICMOS
Terminal Position DUAL
Peak Reflow Temperature (Cel) NOT SPECIFIED
Number of Functions 2
Supply Voltage 4.5V~5.5V
Terminal Pitch 2.54mm
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Base Part Number 74BCT8240
Pin Count 24
Qualification Status Not Qualified
Power Supplies 5V
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Number of Ports 2
Number of Bits 4
Propagation Delay 7.5 ns
Family BCT/FBT
Logic Function Inverting
Output Characteristics 3-STATE
Logic Type Scan Test Device with Inverting Buffers
Output Polarity INVERTED
Max I(ol) 0.064 A
Prop. Delay@Nom-Sup 9 ns
High Level Output Current -15mA
Low Level Output Current 64mA
Control Type ENABLE LOW
Power Supply Current-Max (ICC) 52mA
Number of Output Lines 8
Length 31.64mm
Width 7.62mm
RoHS Status ROHS3 Compliant
See Relate Datesheet

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