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SN74BCT8244ADWR

IC SCAN TEST DEVICE BUFF 24-SOIC


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74BCT8244ADWR
  • Package: 24-SOIC (0.295, 7.50mm Width)
  • Datasheet: PDF
  • Stock: 935
  • Description: IC SCAN TEST DEVICE BUFF 24-SOIC(Kg)

Details

Tags

Parameters
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295, 7.50mm Width)
Number of Pins 24
Weight 624.398247mg
Operating Temperature 0°C~70°C
Packaging Tape & Reel (TR)
Series 74BCT
JESD-609 Code e4
Pbfree Code yes
Part Status Discontinued
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 24
ECCN Code EAR99
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Subcategory Bus Driver/Transceivers
Packing Method TAPE AND REEL
Technology BICMOS
Terminal Position DUAL
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 2
Supply Voltage 4.5V~5.5V
Base Part Number 74BCT8244
Pin Count 24
Number of Outputs 8
Number of Elements 2
Polarity Non-Inverting
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Load Capacitance 50pF
Number of Ports 2
Number of Bits 4
Propagation Delay 29 ns
Quiescent Current 35mA
Family BCT/FBT
Logic Function Buffer
Output Characteristics 3-STATE
Logic Type Scan Test Device with Buffers
Max I(ol) 0.064 A
High Level Output Current -15mA
Low Level Output Current 64mA
Control Type ENABLE LOW
Length 15.4mm
Width 7.5mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Contains Lead
See Relate Datesheet

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