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SN74BCT8244ANT

IC, SCAN TEST DEVICE, DIP-24 - More Details


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74BCT8244ANT
  • Package: 24-DIP (0.300, 7.62mm)
  • Datasheet: -
  • Stock: 218
  • Description: IC, SCAN TEST DEVICE, DIP-24 - More Details(Kg)

Details

Tags

Parameters
Mount Through Hole
Mounting Type Through Hole
Package / Case 24-DIP (0.300, 7.62mm)
Number of Pins 24
Weight 1.753503g
Operating Temperature 0°C~70°C
Packaging Tube
Series 74BCT
JESD-609 Code e4
Pbfree Code yes
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 24
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Subcategory Bus Driver/Transceivers
Technology BICMOS
Terminal Position DUAL
Number of Functions 2
Supply Voltage 4.5V~5.5V
Base Part Number 74BCT8244
Pin Count 24
Operating Supply Voltage 5V
Number of Elements 2
Polarity Non-Inverting
Number of Circuits 8
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Load Capacitance 50pF
Number of Ports 2
Number of Bits 4
Propagation Delay 29 ns
Quiescent Current 35mA
Family BCT/FBT
Logic Function Buffer
Output Characteristics 3-STATE
Logic Type Scan Test Device with Buffers
Max I(ol) 0.064 A
High Level Output Current -15mA
Low Level Output Current 64mA
Control Type ENABLE LOW
Length 31.64mm
Radiation Hardening No
REACH SVHC No SVHC
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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