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SN74BCT8245ANT

IC SCAN TEST DEVICE TXRX 24-DIP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74BCT8245ANT
  • Package: 24-DIP (0.300, 7.62mm)
  • Datasheet: -
  • Stock: 219
  • Description: IC SCAN TEST DEVICE TXRX 24-DIP(Kg)

Details

Tags

Parameters
Mount Through Hole
Mounting Type Through Hole
Package / Case 24-DIP (0.300, 7.62mm)
Number of Pins 24
Weight 1.753503g
Operating Temperature 0°C~70°C
Packaging Tube
Series 74BCT
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 24
Additional Feature WITH DIRECTION CONTROL
Technology BICMOS
Terminal Position DUAL
Number of Functions 1
Supply Voltage 4.5V~5.5V
Terminal Pitch 2.54mm
Base Part Number 74BCT8245
Pin Count 24
Polarity Non-Inverting
Power Supplies 5V
Number of Circuits 1
Max Supply Voltage 5.5V
Min Supply Voltage 4.5V
Number of Ports 2
Number of Bits 8
Propagation Delay 8.7 ns
Family BCT/FBT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE
Logic Type Scan Test Device with Bus Transceivers
Max I(ol) 0.064 A
High Level Output Current -15mA
Low Level Output Current 64mA
Control Type COMMON CONTROL
Power Supply Current-Max (ICC) 52mA
Translation N/A
Width 7.62mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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