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SN74BCT8374ADWR

IC SCAN TEST DEVICE W/FF 24-SOIC


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74BCT8374ADWR
  • Package: 24-SOIC (0.295, 7.50mm Width)
  • Datasheet: PDF
  • Stock: 926
  • Description: IC SCAN TEST DEVICE W/FF 24-SOIC(Kg)

Details

Tags

Parameters
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295, 7.50mm Width)
Number of Pins 24
Operating Temperature 0°C~70°C
Packaging Tape & Reel (TR)
Series 74BCT
Pbfree Code yes
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Number of Terminations 24
Additional Feature SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Subcategory FF/Latches
Packing Method TAPE AND REEL
Technology BICMOS
Terminal Position DUAL
Terminal Form GULL WING
Peak Reflow Temperature (Cel) NOT SPECIFIED
Number of Functions 1
Supply Voltage 4.5V~5.5V
Terminal Pitch 1.27mm
Frequency 70MHz
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Base Part Number 74BCT8374
Pin Count 24
Qualification Status Not Qualified
Operating Supply Voltage 5.5V
Power Supplies 5V
Number of Ports 2
Output Current 64mA
Number of Bits 8
Family BCT/FBT
Logic Function D-Type
Output Characteristics 3-STATE
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Output Polarity TRUE
Max I(ol) 0.064 A
Prop. Delay@Nom-Sup 10 ns
Trigger Type POSITIVE EDGE
Propagation Delay (tpd) 9.5 ns
Power Supply Current-Max (ICC) 52mA
Height Seated (Max) 2.65mm
Length 15.4mm
Width 7.5mm
RoHS Status ROHS3 Compliant
See Relate Datesheet

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