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SN74LVTH182502APM

IC SCAN-TEST-DEV/XCVR 64-LQFP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74LVTH182502APM
  • Package: 64-LQFP
  • Datasheet: PDF
  • Stock: 870
  • Description: IC SCAN-TEST-DEV/XCVR 64-LQFP(Kg)

Details

Tags

Parameters
Factory Lead Time 1 Week
Lifecycle Status ACTIVE (Last Updated: 3 days ago)
Contact Plating Gold
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 64-LQFP
Number of Pins 64
Weight 339.995831mg
Operating Temperature -40°C~85°C
Packaging Tray
Series 74LVTH
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Number of Terminations 64
ECCN Code EAR99
Additional Feature SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Technology BICMOS
Terminal Position QUAD
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 2
Supply Voltage 2.7V~3.6V
Terminal Pitch 0.5mm
Base Part Number 74LVTH182502
Pin Count 64
Output Type TTL
Operating Supply Voltage 3.3V
Number of Elements 2
Polarity Non-Inverting
Max Supply Voltage 3.6V
Min Supply Voltage 2.7V
Load Capacitance 50pF
Number of Ports 2
Number of Bits 18
Propagation Delay 20 ns
Quiescent Current 18mA
Turn On Delay Time 20 ns
Family LVT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE WITH SERIES RESISTOR
Logic Type ABT Scan Test Device With Universal Bus Transceivers
Prop. Delay@Nom-Sup 5.7 ns
Trigger Type POSITIVE EDGE
High Level Output Current -32mA
Low Level Output Current 64mA
Control Type INDEPENDENT CONTROL
Translation N/A
Height 1.6mm
Length 10mm
Width 10mm
Thickness 1.4mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Lead Free
See Relate Datesheet

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