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SN74LVTH182504APM

IC SCAN-TEST-DEV/XCVR 64-LQFP


  • Manufacturer: Texas Instruments
  • Nocochips NO: 815-SN74LVTH182504APM
  • Package: 64-LQFP
  • Datasheet: PDF
  • Stock: 406
  • Description: IC SCAN-TEST-DEV/XCVR 64-LQFP(Kg)

Details

Tags

Parameters
ECCN Code EAR99
Terminal Finish Nickel/Palladium/Gold (Ni/Pd/Au)
Additional Feature SCANNABLE
Technology BICMOS
Terminal Position QUAD
Terminal Form GULL WING
Peak Reflow Temperature (Cel) 260
Number of Functions 1
Supply Voltage 2.7V~3.6V
Terminal Pitch 0.5mm
Base Part Number 74LVTH182504
Pin Count 64
Operating Supply Voltage 3.3V
Number of Elements 1
Polarity Non-Inverting
Max Supply Voltage 3.6V
Min Supply Voltage 2.7V
Load Capacitance 50pF
Number of Ports 2
Number of Bits 20
Propagation Delay 20 ns
Quiescent Current 19.5mA
Turn On Delay Time 20 ns
Family LVT
Logic Function Transceiver
Direction Bidirectional
Output Characteristics 3-STATE WITH SERIES RESISTOR
Logic Type ABT Scan Test Device With Universal Bus Transceivers
Prop. Delay@Nom-Sup 5.9 ns
Control Type INDEPENDENT CONTROL
Power Supply Current-Max (ICC) 27mA
Translation N/A
Height 1.6mm
Length 10mm
Width 10mm
Thickness 1.4mm
Radiation Hardening No
RoHS Status ROHS3 Compliant
Lead Free Contains Lead
Factory Lead Time 1 Week
Lifecycle Status ACTIVE (Last Updated: 3 days ago)
Mount Surface Mount
Mounting Type Surface Mount
Package / Case 64-LQFP
Number of Pins 64
Weight 339.995831mg
Operating Temperature -40°C~85°C
Packaging Tray
Series 74LVTH
JESD-609 Code e4
Pbfree Code yes
Part Status Active
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Number of Terminations 64
See Relate Datesheet

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